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/dev/nvme0: failed/dev/nvme1: failed
$ sudo smartctl -a /dev/nvme0
smartctl 7.4 2023-08-01 r5530 [aarch64-linux-6.12.8] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Number: SAMSUNG MZQL2960HCJR-00A07
Serial Number: S64FNE0R705062
Firmware Version: GDC5802Q
PCI Vendor/Subsystem ID: 0x144d
IEEE OUI Identifier: 0x002538
Total NVM Capacity: 960,197,124,096 [960 GB]
Unallocated NVM Capacity: 0
Controller ID: 6
NVMe Version: 1.4
Number of Namespaces: 32
Local Time is: Mon Jan 6 02:00:03 2025 UTC
Firmware Updates (0x17): 3 Slots, Slot 1 R/O, no Reset required
Optional Admin Commands (0x005f): Security Format Frmw_DL NS_Mngmt Self_Test MI_Snd/Rec
Optional NVM Commands (0x005f): Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Timestmp
Log Page Attributes (0x0e): Cmd_Eff_Lg Ext_Get_Lg Telmtry_Lg
Maximum Data Transfer Size: 512 Pages
Warning Comp. Temp. Threshold: 80 Celsius
Critical Comp. Temp. Threshold: 83 Celsius
Supported Power States
St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat
0 + 25.00W 14.00W - 0 0 0 0 70 70
1 + 8.00W 8.00W - 1 1 1 1 70 70
=== START OF SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
- NVM subsystem reliability has been degraded
SMART/Health Information (NVMe Log 0x02)
Critical Warning: 0x04
Temperature: 37 Celsius
Available Spare: 100%
Available Spare Threshold: 10%
Percentage Used: 162%
Data Units Read: 99,104,725 [50.7 TB]
Data Units Written: 8,772,715,905 [4.49 PB]
Host Read Commands: 1,660,627,155
Host Write Commands: 26,755,837,383
Controller Busy Time: 157,851
Power Cycles: 75
Power On Hours: 18,552
Unsafe Shutdowns: 43
Media and Data Integrity Errors: 0
Error Information Log Entries: 2
Warning Comp. Temperature Time: 0
Critical Comp. Temperature Time: 0
Temperature Sensor 1: 37 Celsius
Temperature Sensor 2: 46 Celsius
Error Information (NVMe Log 0x01, 16 of 64 entries)
No Errors Logged
Self-test Log (NVMe Log 0x06)
Self-test status: No self-test in progress
No Self-tests Logged
$ sudo smartctl -a /dev/nvme1
smartctl 7.4 2023-08-01 r5530 [aarch64-linux-6.12.8] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Number: SAMSUNG MZQL2960HCJR-00A07
Serial Number: S64FNE0R705075
Firmware Version: GDC5802Q
PCI Vendor/Subsystem ID: 0x144d
IEEE OUI Identifier: 0x002538
Total NVM Capacity: 960,197,124,096 [960 GB]
Unallocated NVM Capacity: 0
Controller ID: 6
NVMe Version: 1.4
Number of Namespaces: 32
Local Time is: Mon Jan 6 02:01:10 2025 UTC
Firmware Updates (0x17): 3 Slots, Slot 1 R/O, no Reset required
Optional Admin Commands (0x005f): Security Format Frmw_DL NS_Mngmt Self_Test MI_Snd/Rec
Optional NVM Commands (0x005f): Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Timestmp
Log Page Attributes (0x0e): Cmd_Eff_Lg Ext_Get_Lg Telmtry_Lg
Maximum Data Transfer Size: 512 Pages
Warning Comp. Temp. Threshold: 80 Celsius
Critical Comp. Temp. Threshold: 83 Celsius
Supported Power States
St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat
0 + 25.00W 14.00W - 0 0 0 0 70 70
1 + 8.00W 8.00W - 1 1 1 1 70 70
=== START OF SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
- NVM subsystem reliability has been degraded
SMART/Health Information (NVMe Log 0x02)
Critical Warning: 0x04
Temperature: 38 Celsius
Available Spare: 100%
Available Spare Threshold: 10%
Percentage Used: 162%
Data Units Read: 93,544,486 [47.8 TB]
Data Units Written: 8,777,740,538 [4.49 PB]
Host Read Commands: 1,651,517,678
Host Write Commands: 26,771,573,419
Controller Busy Time: 158,789
Power Cycles: 75
Power On Hours: 18,552
Unsafe Shutdowns: 42
Media and Data Integrity Errors: 0
Error Information Log Entries: 2
Warning Comp. Temperature Time: 0
Critical Comp. Temperature Time: 0
Temperature Sensor 1: 38 Celsius
Temperature Sensor 2: 47 Celsius
Error Information (NVMe Log 0x01, 16 of 64 entries)
No Errors Logged
Self-test Log (NVMe Log 0x06)
Self-test status: No self-test in progress
No Self-tests Logged
mweinelt
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