Skip to content

smart warnings build05 #1644

@zowoq

Description

@zowoq
  • /dev/nvme0: failed
  • /dev/nvme1: failed
$ sudo smartctl -a /dev/nvme0
smartctl 7.4 2023-08-01 r5530 [aarch64-linux-6.12.8] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Number:                       SAMSUNG MZQL2960HCJR-00A07
Serial Number:                      S64FNE0R705062
Firmware Version:                   GDC5802Q
PCI Vendor/Subsystem ID:            0x144d
IEEE OUI Identifier:                0x002538
Total NVM Capacity:                 960,197,124,096 [960 GB]
Unallocated NVM Capacity:           0
Controller ID:                      6
NVMe Version:                       1.4
Number of Namespaces:               32
Local Time is:                      Mon Jan  6 02:00:03 2025 UTC
Firmware Updates (0x17):            3 Slots, Slot 1 R/O, no Reset required
Optional Admin Commands (0x005f):   Security Format Frmw_DL NS_Mngmt Self_Test MI_Snd/Rec
Optional NVM Commands (0x005f):     Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Timestmp
Log Page Attributes (0x0e):         Cmd_Eff_Lg Ext_Get_Lg Telmtry_Lg
Maximum Data Transfer Size:         512 Pages
Warning  Comp. Temp. Threshold:     80 Celsius
Critical Comp. Temp. Threshold:     83 Celsius

Supported Power States
St Op     Max   Active     Idle   RL RT WL WT  Ent_Lat  Ex_Lat
 0 +    25.00W   14.00W       -    0  0  0  0       70      70
 1 +     8.00W    8.00W       -    1  1  1  1       70      70

=== START OF SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
- NVM subsystem reliability has been degraded

SMART/Health Information (NVMe Log 0x02)
Critical Warning:                   0x04
Temperature:                        37 Celsius
Available Spare:                    100%
Available Spare Threshold:          10%
Percentage Used:                    162%
Data Units Read:                    99,104,725 [50.7 TB]
Data Units Written:                 8,772,715,905 [4.49 PB]
Host Read Commands:                 1,660,627,155
Host Write Commands:                26,755,837,383
Controller Busy Time:               157,851
Power Cycles:                       75
Power On Hours:                     18,552
Unsafe Shutdowns:                   43
Media and Data Integrity Errors:    0
Error Information Log Entries:      2
Warning  Comp. Temperature Time:    0
Critical Comp. Temperature Time:    0
Temperature Sensor 1:               37 Celsius
Temperature Sensor 2:               46 Celsius

Error Information (NVMe Log 0x01, 16 of 64 entries)
No Errors Logged

Self-test Log (NVMe Log 0x06)
Self-test status: No self-test in progress
No Self-tests Logged
$ sudo smartctl -a /dev/nvme1
smartctl 7.4 2023-08-01 r5530 [aarch64-linux-6.12.8] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Number:                       SAMSUNG MZQL2960HCJR-00A07
Serial Number:                      S64FNE0R705075
Firmware Version:                   GDC5802Q
PCI Vendor/Subsystem ID:            0x144d
IEEE OUI Identifier:                0x002538
Total NVM Capacity:                 960,197,124,096 [960 GB]
Unallocated NVM Capacity:           0
Controller ID:                      6
NVMe Version:                       1.4
Number of Namespaces:               32
Local Time is:                      Mon Jan  6 02:01:10 2025 UTC
Firmware Updates (0x17):            3 Slots, Slot 1 R/O, no Reset required
Optional Admin Commands (0x005f):   Security Format Frmw_DL NS_Mngmt Self_Test MI_Snd/Rec
Optional NVM Commands (0x005f):     Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Timestmp
Log Page Attributes (0x0e):         Cmd_Eff_Lg Ext_Get_Lg Telmtry_Lg
Maximum Data Transfer Size:         512 Pages
Warning  Comp. Temp. Threshold:     80 Celsius
Critical Comp. Temp. Threshold:     83 Celsius

Supported Power States
St Op     Max   Active     Idle   RL RT WL WT  Ent_Lat  Ex_Lat
 0 +    25.00W   14.00W       -    0  0  0  0       70      70
 1 +     8.00W    8.00W       -    1  1  1  1       70      70

=== START OF SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
- NVM subsystem reliability has been degraded

SMART/Health Information (NVMe Log 0x02)
Critical Warning:                   0x04
Temperature:                        38 Celsius
Available Spare:                    100%
Available Spare Threshold:          10%
Percentage Used:                    162%
Data Units Read:                    93,544,486 [47.8 TB]
Data Units Written:                 8,777,740,538 [4.49 PB]
Host Read Commands:                 1,651,517,678
Host Write Commands:                26,771,573,419
Controller Busy Time:               158,789
Power Cycles:                       75
Power On Hours:                     18,552
Unsafe Shutdowns:                   42
Media and Data Integrity Errors:    0
Error Information Log Entries:      2
Warning  Comp. Temperature Time:    0
Critical Comp. Temperature Time:    0
Temperature Sensor 1:               38 Celsius
Temperature Sensor 2:               47 Celsius

Error Information (NVMe Log 0x01, 16 of 64 entries)
No Errors Logged

Self-test Log (NVMe Log 0x06)
Self-test status: No self-test in progress
No Self-tests Logged

Metadata

Metadata

Assignees

No one assigned

    Labels

    No labels
    No labels

    Type

    No type

    Projects

    No projects

    Milestone

    No milestone

    Relationships

    None yet

    Development

    No branches or pull requests

    Issue actions